Change in Admittance of HfO2 Metal-Insulator-Metal (MIM) Capacitors after dc Bias Stress

Title
Change in Admittance of HfO2 Metal-Insulator-Metal (MIM) Capacitors after dc Bias Stress
Authors
Keywords
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Journal
ECS Solid State Letters
Volume 2, Issue 5, Pages N15-N17
Publisher
The Electrochemical Society
Online
2013-02-21
DOI
10.1149/2.003305ssl

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