Change in Admittance of HfO2 Metal-Insulator-Metal (MIM) Capacitors after dc Bias Stress

标题
Change in Admittance of HfO2 Metal-Insulator-Metal (MIM) Capacitors after dc Bias Stress
作者
关键词
-
出版物
ECS Solid State Letters
Volume 2, Issue 5, Pages N15-N17
出版商
The Electrochemical Society
发表日期
2013-02-21
DOI
10.1149/2.003305ssl

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