Improved Negative Bias Stress Stability of IZO Thin Film Transistors via Post-Vacuum Annealing of Solution Method
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Title
Improved Negative Bias Stress Stability of IZO Thin Film Transistors via Post-Vacuum Annealing of Solution Method
Authors
Keywords
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Journal
ECS Journal of Solid State Science and Technology
Volume 2, Issue 7, Pages Q99-Q103
Publisher
The Electrochemical Society
Online
2013-05-18
DOI
10.1149/2.007307jss
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