Total ionizing dose-hardened carbon nanotube thin-film transistors with silicon oxynitride gate dielectrics

Title
Total ionizing dose-hardened carbon nanotube thin-film transistors with silicon oxynitride gate dielectrics
Authors
Keywords
-
Journal
MRS Communications
Volume 1, Issue 01, Pages 27-31
Publisher
Cambridge University Press (CUP)
Online
2011-08-25
DOI
10.1557/mrc.2011.10

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