50-nm-resolution full-field X-ray microscope without chromatic aberration using total-reflection imaging mirrors

Title
50-nm-resolution full-field X-ray microscope without chromatic aberration using total-reflection imaging mirrors
Authors
Keywords
-
Journal
Scientific Reports
Volume 7, Issue 1, Pages -
Publisher
Springer Nature
Online
2017-04-13
DOI
10.1038/srep46358

Ask authors/readers for more resources

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started