Investigating carrier localization and transfer in InGaN/GaN quantum wells with V-pits using near-field scanning optical microscopy and correlation analysis
Published 2017 View Full Article
- Home
- Publications
- Publication Search
- Publication Details
Title
Investigating carrier localization and transfer in InGaN/GaN quantum wells with V-pits using near-field scanning optical microscopy and correlation analysis
Authors
Keywords
-
Journal
Scientific Reports
Volume 7, Issue 1, Pages -
Publisher
Springer Nature
Online
2017-02-13
DOI
10.1038/srep42221
References
Ask authors/readers for more resources
Related references
Note: Only part of the references are listed.- Wafer-scale porous GaN single crystal substrates and their application in energy storage
- (2016) Jiaoxian Yu et al. CRYSTENGCOMM
- Impact of carrier localization on radiative recombination times in semipolar (202¯1) plane InGaN/GaN quantum wells
- (2015) R. Ivanov et al. APPLIED PHYSICS LETTERS
- Manipulation of nanoscale V-pits to optimize internal quantum efficiency of InGaN multiple quantum wells
- (2015) Chiao-Yun Chang et al. APPLIED PHYSICS LETTERS
- High spatial uniformity of photoluminescence spectra in semipolar (202¯1) plane InGaN/GaN quantum wells
- (2015) K. Gelžinytė et al. JOURNAL OF APPLIED PHYSICS
- V-pits as Barriers to Diffusion of Carriers in InGaN/GaN Quantum Wells
- (2015) Mi-Hyang Sheen et al. JOURNAL OF ELECTRONIC MATERIALS
- Structural, electronic, and optical properties ofm-plane InGaN/GaN quantum wells: Insights from experiment and atomistic theory
- (2015) S. Schulz et al. PHYSICAL REVIEW B
- Carrier redistribution between different potential sites in semipolar (202¯1) InGaN quantum wells studied by near-field photoluminescence
- (2014) S. Marcinkevičius et al. APPLIED PHYSICS LETTERS
- Characterization of dislocations in MOCVD-grown GaN using a high temperature annealing method
- (2014) Yuan Tian et al. CRYSTENGCOMM
- Structure and strain relaxation effects of defects in InxGa1−xN epilayers
- (2014) S. L. Rhode et al. JOURNAL OF APPLIED PHYSICS
- The influence of random indium alloy fluctuations in indium gallium nitride quantum wells on the device behavior
- (2014) Tsung-Jui Yang et al. JOURNAL OF APPLIED PHYSICS
- Roles of V-shaped pits on the improvement of quantum efficiency in InGaN/GaN multiple quantum well light-emitting diodes
- (2014) JOURNAL OF APPLIED PHYSICS
- Influence of V-pits on the efficiency droop in InGaN/GaN quantum wells
- (2014) Jaekyun Kim et al. OPTICS EXPRESS
- Near-field investigation of spatial variations of (202¯1¯) InGaN quantum well emission spectra
- (2013) S. Marcinkevičius et al. APPLIED PHYSICS LETTERS
- Optical properties of extended and localized states in m-plane InGaN quantum wells
- (2013) S. Marcinkevičius et al. APPLIED PHYSICS LETTERS
- Improvement of efficiency and electrical properties using intentionally formed V-shaped pits in InGaN/GaN multiple quantum well light-emitting diodes
- (2013) Sang-Heon Han et al. APPLIED PHYSICS LETTERS
- Effect of V-Shaped Pit Size on the Reverse Leakage Current of InGaN/GaN Light-Emitting Diodes
- (2013) Jaekyun Kim et al. IEEE ELECTRON DEVICE LETTERS
- Nanoscopic Photoluminescence Properties of a Green-Emitting InGaN Single Quantum Well on a $\{20\bar{2}1\}$ GaN Substrate Probed by Scanning Near-Field Optical Microscopy
- (2012) Akio Kaneta et al. Applied Physics Express
- Carriers capturing of V-defect and its effect on leakage current and electroluminescence in InGaN-based light-emitting diodes
- (2012) L. C. Le et al. APPLIED PHYSICS LETTERS
- Atomic scale characterization of GaInN/GaN multiple quantum wells in V-shaped pits
- (2011) Shigetaka Tomiya et al. APPLIED PHYSICS LETTERS
- Carrier localization in m-plane InGaN/GaN quantum wells probed by scanning near field optical spectroscopy
- (2010) V. Liuolia et al. APPLIED PHYSICS LETTERS
- Effect of indium surfactant on stress relaxation by V-defect formation in GaN epilayers grown by metalorganic chemical vapor deposition
- (2010) Dongjin Won et al. JOURNAL OF APPLIED PHYSICS
- Natural white light
- (2010) Noriaki Horiuchi Nature Photonics
- Investigation on the strain relaxation of InGaN layer and its effects on the InGaN structural and optical properties
- (2010) H. Wang et al. PHYSICA B-CONDENSED MATTER
- Advances in group III-nitride-based deep UV light-emitting diode technology
- (2010) M Kneissl et al. SEMICONDUCTOR SCIENCE AND TECHNOLOGY
- Internal quantum efficiency and nonradiative recombination coefficient of GaInN/GaN multiple quantum wells with different dislocation densities
- (2009) Q. Dai et al. APPLIED PHYSICS LETTERS
- High-Power and High-Efficiency InGaN-Based Light Emitters
- (2009) Ansgar Laubsch et al. IEEE TRANSACTIONS ON ELECTRON DEVICES
- Microstructures produced during the epitaxial growth of InGaN alloys
- (2009) G.B. Stringfellow JOURNAL OF CRYSTAL GROWTH
- Bowing of the band gap pressure coefficient in InxGa1−xN alloys
- (2008) G. Franssen et al. JOURNAL OF APPLIED PHYSICS
- Nanoscopic recombination processes in InGaN/GaN quantum wells emitting violet, blue, and green spectra
- (2008) A. Kaneta et al. PHYSICAL REVIEW B
Discover Peeref hubs
Discuss science. Find collaborators. Network.
Join a conversationPublish scientific posters with Peeref
Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.
Learn More