Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space
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Title
Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space
Authors
Keywords
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Journal
Scientific Reports
Volume 6, Issue 1, Pages -
Publisher
Springer Nature
Online
2016-08-12
DOI
10.1038/srep30557
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