Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy

Published 2016 View Full Article

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Title
Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy
Authors
Keywords
-
Journal
NANOTECHNOLOGY
Volume 27, Issue 10, Pages 105706
Publisher
IOP Publishing
Online
2016-02-12
DOI
10.1088/0957-4484/27/10/105706

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