XRD and XPS studies of room temperature spontaneous interfacial reaction of CeO2 thin films on Si and Si3N4 substrates

Title
XRD and XPS studies of room temperature spontaneous interfacial reaction of CeO2 thin films on Si and Si3N4 substrates
Authors
Keywords
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Journal
RSC Advances
Volume 4, Issue 108, Pages 62935-62939
Publisher
Royal Society of Chemistry (RSC)
Online
2014-10-24
DOI
10.1039/c4ra09882j

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