Estimating Kapitza Resistance Between ${\rm Si}\hbox{-}{\rm SiO}_{2}$ Interface Using Molecular Dynamics Simulations

Authors

Keywords

Journal

Volume 1, Issue 8, Pages 1132-1139

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Online

2011-07-21

DOI

10.1109/tcpmt.2011.2112356

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