3D strain measurement in electronic devices using through-focal annular dark-field imaging

Published 2014 View Full Article

  1. Home
  2. Publications
  3. Publication Search
  4. Publication Details
Title
3D strain measurement in electronic devices using through-focal annular dark-field imaging
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 146, Issue -, Pages 1-5
Publisher
Elsevier BV
Online
2014-05-11
DOI
10.1016/j.ultramic.2014.04.010

Ask authors/readers for more resources

Protocol

Community support

Reagent

Community support

Reprint

Contact the author

Create your own webinar

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started
Webinars Posters Questions Hubs Funding Journals Articles Connect Collections Reviewers About Us FAQs Mobile App Privacy Policy Terms of Use
© Peeref 2019-2024. All rights reserved.