Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: Effects of detector binning and step size

Title
Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: Effects of detector binning and step size
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 125, Issue -, Pages 1-9
Publisher
Elsevier BV
Online
2012-11-23
DOI
10.1016/j.ultramic.2012.11.003

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