Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: Effects of detector binning and step size
Measurement of geometrically necessary dislocation density with high resolution electron backscatter diffraction: Effects of detector binning and step size
Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.
Publish scientific posters with Peeref
Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.
Learn MoreAdd your recorded webinar
Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.
Upload Now