Aberration-corrected transmission electron microscopy analyses of GaAs/Si interfaces in wafer-bonded multi-junction solar cells

Published 2013 View Full Article

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Title
Aberration-corrected transmission electron microscopy analyses of GaAs/Si interfaces in wafer-bonded multi-junction solar cells
Authors
Keywords
-
Journal
ULTRAMICROSCOPY
Volume 134, Issue -, Pages 55-61
Publisher
Elsevier BV
Online
2013-07-20
DOI
10.1016/j.ultramic.2013.07.005

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