Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer

Published 2008 View Full Article

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Title
Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer
Authors
Keywords
-
Journal
TRIBOLOGY LETTERS
Volume 32, Issue 1, Pages 49-57
Publisher
Springer Nature
Online
2008-09-23
DOI
10.1007/s11249-008-9360-z

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