Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer

标题
Transmission Electron Microscopy Analysis of Mo–W–S–Se Film Sliding Contact Obtained by Using Focused Ion Beam Microscope and In Situ Microtribometer
作者
关键词
-
出版物
TRIBOLOGY LETTERS
Volume 32, Issue 1, Pages 49-57
出版商
Springer Nature
发表日期
2008-09-23
DOI
10.1007/s11249-008-9360-z

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