Resistive switching effect in HfxAl1−xOy with a graded Al depth profile studied by hard X-ray photoelectron spectroscopy

Published 2014 View Full Article

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Title
Resistive switching effect in HfxAl1−xOy with a graded Al depth profile studied by hard X-ray photoelectron spectroscopy
Authors
Keywords
-
Journal
THIN SOLID FILMS
Volume 563, Issue -, Pages 20-23
Publisher
Elsevier BV
Online
2014-02-15
DOI
10.1016/j.tsf.2014.02.027

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