Resistive switching effect in HfxAl1−xOy with a graded Al depth profile studied by hard X-ray photoelectron spectroscopy

标题
Resistive switching effect in HfxAl1−xOy with a graded Al depth profile studied by hard X-ray photoelectron spectroscopy
作者
关键词
-
出版物
THIN SOLID FILMS
Volume 563, Issue -, Pages 20-23
出版商
Elsevier BV
发表日期
2014-02-15
DOI
10.1016/j.tsf.2014.02.027

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