Interface width evaluation in thin layered CoFeB/MgO multilayers including Ru or Ta buffer layer by X-ray reflectivity

Published 2012 View Full Article

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Title
Interface width evaluation in thin layered CoFeB/MgO multilayers including Ru or Ta buffer layer by X-ray reflectivity
Authors
Keywords
-
Journal
THIN SOLID FILMS
Volume 533, Issue -, Pages 79-82
Publisher
Elsevier BV
Online
2012-12-16
DOI
10.1016/j.tsf.2012.11.130

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