Interface width evaluation in thin layered CoFeB/MgO multilayers including Ru or Ta buffer layer by X-ray reflectivity

标题
Interface width evaluation in thin layered CoFeB/MgO multilayers including Ru or Ta buffer layer by X-ray reflectivity
作者
关键词
-
出版物
THIN SOLID FILMS
Volume 533, Issue -, Pages 79-82
出版商
Elsevier BV
发表日期
2012-12-16
DOI
10.1016/j.tsf.2012.11.130

向作者/读者发起求助以获取更多资源

Find Funding. Review Successful Grants.

Explore over 25,000 new funding opportunities and over 6,000,000 successful grants.

Explore

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation