Capacitance–voltage characterization of silicon oxide and silicon nitride coatings as passivation layers for crystalline silicon solar cells and investigation of their stability against x-radiation

Published 2011 View Full Article

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Keywords

Journal

THIN SOLID FILMS

Volume 519, Issue 19, Pages 6525-6529

Publisher

Elsevier BV

Online

2011-04-25

DOI

10.1016/j.tsf.2011.04.107

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THIN SOLID FILMS

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