Capacitance–voltage characterization of silicon oxide and silicon nitride coatings as passivation layers for crystalline silicon solar cells and investigation of their stability against x-radiation

标题
Capacitance–voltage characterization of silicon oxide and silicon nitride coatings as passivation layers for crystalline silicon solar cells and investigation of their stability against x-radiation
作者
关键词
-
出版物
THIN SOLID FILMS
Volume 519, Issue 19, Pages 6525-6529
出版商
Elsevier BV
发表日期
2011-04-25
DOI
10.1016/j.tsf.2011.04.107

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