Effect of gallium content on bias stress stability of solution-deposited Ga–Sn–Zn–O semiconductor transistors

Published 2011 View Full Article

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Title
Effect of gallium content on bias stress stability of solution-deposited Ga–Sn–Zn–O semiconductor transistors
Authors
Keywords
-
Journal
THIN SOLID FILMS
Volume 519, Issue 18, Pages 6164-6168
Publisher
Elsevier BV
Online
2011-04-20
DOI
10.1016/j.tsf.2011.04.030

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