Degradation-Based Burn-In Planning Under Competing Risks

Burn-in by environmental shocks for two ordered subpopulations

(2010) Ji Hwan Cha et al.   EUROPEAN JOURNAL OF OPERATIONAL RESEARCH

Bayesian Analysis of Hazard Rate, Change Point, and Cost-Optimal Burn-In Time for Electronic Devices

(2010) Tao Yuan et al.   IEEE TRANSACTIONS ON RELIABILITY

Accelerated Life Test Plans for Repairable Systems With Multiple Independent Risks

(2010) Xiao Liu et al.   IEEE TRANSACTIONS ON RELIABILITY

Optimal Burn-In Policy for Highly Reliable Products Using Gamma Degradation Process

(2010) Chih-Chun Tsai et al.   IEEE TRANSACTIONS ON RELIABILITY

Coordinated Multistage Scheduling of Parallel Batch-Processing Machines Under Multiresource Constraints

(2010) Payman Jula et al.   OPERATIONS RESEARCH

Optimum Specimen Sizes and Sample Allocation for Estimating Weibull Shape Parameters for Two Competing Failure Modes

(2010) Kazuyuki Suzuki et al.   TECHNOMETRICS

Field-Failure and Warranty Prediction Based on Auxiliary Use-Rate Information

(2010) Yili Hong et al.   TECHNOMETRICS

Using Accelerated Life Tests Results to Predict Product Field Reliability

(2009) William Q. Meeker et al.   TECHNOMETRICS