Atomic and subnanometer resolution in ambient conditions by atomic force microscopy

标题
Atomic and subnanometer resolution in ambient conditions by atomic force microscopy
作者
关键词
-
出版物
SURFACE SCIENCE REPORTS
Volume 64, Issue 3, Pages 99-121
出版商
Elsevier BV
发表日期
2009-01-20
DOI
10.1016/j.surfrep.2008.12.001

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