Electron microscopy and spectroscopy investigations of CuOx–CeO2−δ/Si thin films

Published 2008 View Full Article

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Title
Electron microscopy and spectroscopy investigations of CuOx–CeO2−δ/Si thin films
Authors
Keywords
-
Journal
SURFACE SCIENCE
Volume 602, Issue 7, Pages 1313-1321
Publisher
Elsevier BV
Online
2008-01-14
DOI
10.1016/j.susc.2007.12.041

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