Electron microscopy and spectroscopy investigations of CuOx–CeO2−δ/Si thin films

标题
Electron microscopy and spectroscopy investigations of CuOx–CeO2−δ/Si thin films
作者
关键词
-
出版物
SURFACE SCIENCE
Volume 602, Issue 7, Pages 1313-1321
出版商
Elsevier BV
发表日期
2008-01-14
DOI
10.1016/j.susc.2007.12.041

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