Fundamental aspects of Arn+SIMS profiling of common organic semiconductors

Molecular depth profiling of organic photovoltaic heterojunction layers by ToF-SIMS: comparative evaluation of three sputtering beams

(2013) T. Mouhib et al.   ANALYST

Molecular Dynamics Study of Fullerite Cross-Linking under keV C60 and Arn Cluster Bombardment

(2013) Bartlomiej Czerwinski et al.   Journal of Physical Chemistry C

Universal Equation for Argon Gas Cluster Sputtering Yields

(2013) M. P. Seah   Journal of Physical Chemistry C

Argon Cluster Ion Beams for Organic Depth Profiling: Results from a VAMAS Interlaboratory Study

(2012) Alexander G. Shard et al.   ANALYTICAL CHEMISTRY

Analysis of organic multilayers and 3D structures using Ar cluster ions

(2012) E. Niehuis et al.   SURFACE AND INTERFACE ANALYSIS

Dual beam depth profiling of polymer materials: comparison of C60and Ar cluster ion beams for sputtering

(2012) D. Rading et al.   SURFACE AND INTERFACE ANALYSIS

Dynamics of large Ar cluster bombardment of organic solids

(2012) Z. Postawa et al.   SURFACE AND INTERFACE ANALYSIS

Surface sputtering with nanoclusters: the relevant parameters

(2012) A. Delcorte et al.   SURFACE AND INTERFACE ANALYSIS

Degradation of deep ultraviolet photoresist by As-implantation studied by Ar-cluster beam profiling

(2012) T. Conard et al.   SURFACE AND INTERFACE ANALYSIS

Surface spectrometry using large argon clusters

(2012) S. Kayser et al.   SURFACE AND INTERFACE ANALYSIS

Energy-dependent fragmentation of polystyrene molecule using size-selected Ar gas cluster ion beam projectile

(2010) Kousuke Moritani et al.   SURFACE AND INTERFACE ANALYSIS