A unique approach to reveal the nanocomposite nc-MN/SiN-layer architecture of thin films via electrical measurements

Title
A unique approach to reveal the nanocomposite nc-MN/SiN-layer architecture of thin films via electrical measurements
Authors
Keywords
-
Journal
SURFACE & COATINGS TECHNOLOGY
Volume 204, Issue 12-13, Pages 1907-1913
Publisher
Elsevier BV
Online
2009-12-05
DOI
10.1016/j.surfcoat.2009.11.045

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