Journal
SURFACE & COATINGS TECHNOLOGY
Volume 202, Issue 11, Pages 2477-2481Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.surfcoat.2007.09.050
Keywords
PECVD; silicon oxide; thin films; bacterial adhesion; dental prostheses
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In this work we present some results about the low temperature, plasma-assisted growth of silicon-oxygen amorphous thin film alloys (a-SiO(x)) on different types of dental materials used for the fabrication of dental prostheses. The a-SiO(x) films were grown at substrate temperatures lower than 70 degrees C by a PECVD deposition system using silane (SiH(4)) and nitrous oxide (N(2)O) as precursor gases. The chemical bonding structure of the films was investigated by Fourier transform infra-red spectroscopy (FTIR), while the morphological characteristics of the dental materials were analyzed before and after the coating deposition by means of high-resolution mechanical profilometry. The surface energy of dental materials was estimated before and after the coating process by contact angle measurements, revealing that the coating produced a considerable change of surface energy in all the tested samples, evidenced by a contact angle reduction from more than 90 degrees to less than 10 degrees. Some tests were also performed to estimate the effect of the coating on the bacterial adhesion properties, revealing that the a-SiO(x) coatings show some effectiveness in reducing the bacterial adhesion on the dental materials surface. (C) 2007 Elsevier B.V. All rights reserved.
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