DLTS analysis of amphoteric interface defects in high-TiO2 MOS structures prepared by sol-gel spin-coating

Title
DLTS analysis of amphoteric interface defects in high-TiO2 MOS structures prepared by sol-gel spin-coating
Authors
Keywords
-
Journal
AIP Advances
Volume 5, Issue 11, Pages 117122
Publisher
AIP Publishing
Online
2015-11-11
DOI
10.1063/1.4935749

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