Viewing Angle Classification of Cryo-Electron Microscopy Images Using Eigenvectors

Title
Viewing Angle Classification of Cryo-Electron Microscopy Images Using Eigenvectors
Authors
Keywords
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Journal
SIAM Journal on Imaging Sciences
Volume 4, Issue 2, Pages 723-759
Publisher
Society for Industrial & Applied Mathematics (SIAM)
Online
2011-06-25
DOI
10.1137/090778390

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