Viewing Angle Classification of Cryo-Electron Microscopy Images Using Eigenvectors

标题
Viewing Angle Classification of Cryo-Electron Microscopy Images Using Eigenvectors
作者
关键词
-
出版物
SIAM Journal on Imaging Sciences
Volume 4, Issue 2, Pages 723-759
出版商
Society for Industrial & Applied Mathematics (SIAM)
发表日期
2011-06-25
DOI
10.1137/090778390

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