An Approach for Characterizing and Comparing Hyperspectral Microscopy Systems

Title
An Approach for Characterizing and Comparing Hyperspectral Microscopy Systems
Authors
Keywords
-
Journal
SENSORS
Volume 13, Issue 7, Pages 9267-9293
Publisher
MDPI AG
Online
2013-07-20
DOI
10.3390/s130709267

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