Analyzing technology impact networks for R&D planning using patents: combined application of network approaches
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Title
Analyzing technology impact networks for R&D planning using patents: combined application of network approaches
Authors
Keywords
Patent analysis, Technology impact network, Patent co-classification analysis, DEMATEL, Social network analysis, R&D planning, C63, C82
Journal
SCIENTOMETRICS
Volume 101, Issue 1, Pages 917-936
Publisher
Springer Nature
Online
2014-06-03
DOI
10.1007/s11192-014-1343-2
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