A comparison of conventional Everhart-Thornley style and in-lens secondary electron detectors-a further variable in scanning electron microscopy

Published 2011 View Full Article

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Title
A comparison of conventional Everhart-Thornley style and in-lens secondary electron detectors-a further variable in scanning electron microscopy
Authors
Keywords
-
Journal
SCANNING
Volume 33, Issue 3, Pages 162-173
Publisher
Wiley
Online
2011-06-21
DOI
10.1002/sca.20255
References
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