A non-contact, thermal noise based method for the calibration of lateral deflection sensitivity in atomic force microscopy

Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope

(2012) Sarice S. Barkley et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Spring constant calibration of atomic force microscope cantilevers of arbitrary shape

(2012) John E. Sader et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Shape-Independent Lateral Force Calibration

(2011) Evan V. Anderson et al.   ACS Applied Materials & Interfaces

Noncontact Method for Calibration of Lateral Forces in Scanning Force Microscopy

(2011) Kyle Wagner et al.   LANGMUIR

Distortion in the thermal noise spectrum and quality factor of nanomechanical devices due to finite frequency resolution with applications to the atomic force microscope

(2011) John E. Sader et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Gwyddion: an open-source software for SPM data analysis

(2011) David Nečas et al.   Open Physics

Force calibration in lateral force microscopy: a review of the experimental methods

(2010) Martin Munz   JOURNAL OF PHYSICS D-APPLIED PHYSICS

Atomic force microscopy spring constant determination in viscous liquids

(2009) Tobias Pirzer et al.   REVIEW OF SCIENTIFIC INSTRUMENTS