Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope

Title
Quantitative comparison of two independent lateral force calibration techniques for the atomic force microscope
Authors
Keywords
-
Journal
REVIEW OF SCIENTIFIC INSTRUMENTS
Volume 83, Issue 2, Pages 023707
Publisher
AIP Publishing
Online
2012-02-16
DOI
10.1063/1.3685243

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