A novel instrument for quantitative nanoanalytics involving complementary X-ray methodologies

Chemical speciation at buried interfaces in high-temperature processed polycrystalline silicon thin-film solar cells on ZnO:Al

(2013) Christiane Becker et al.   JOURNAL OF APPLIED PHYSICS

Nondestructive and Nonpreparative Chemical Nanometrology of Internal Material Interfaces at Tunable High Information Depths

(2012) Beatrix Pollakowski et al.   ANALYTICAL CHEMISTRY

Characterization of ultra-shallow aluminum implants in silicon by grazing incidence and grazing emission X-ray fluorescence spectroscopy

(2012) P. Hönicke et al.   JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

Complementary Characterization of Buried Nanolayers by Quantitative X-ray Fluorescence Spectrometry under Conventional and Grazing Incidence Conditions

(2011) Rainer Unterumsberger et al.   ANALYTICAL CHEMISTRY

Reference-free quantification of particle-like surface contaminations by grazing incidence X-ray fluorescence analysis

(2011) Falk Reinhardt et al.   JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

Towards Passivation of Ge(100) Surfaces by Sulfur Adsorption from a (NH4)2S Solution: A Combined NEXAFS, STM and LEED Study

(2011) C. Fleischmann et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

Reaction mechanisms for atomic layer deposition of aluminum oxide on semiconductor substrates

(2011) Annelies Delabie et al.   JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A

Large-area fabrication of equidistant free-standing Si crystals on nanoimprinted glass

(2011) Tobias Sontheimer et al.   Physica Status Solidi-Rapid Research Letters

SRIM – The stopping and range of ions in matter (2010)

(2010) James F. Ziegler et al.   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

Depth profile characterization of ultra shallow junction implants

(2009) Philipp Hönicke et al.   ANALYTICAL AND BIOANALYTICAL CHEMISTRY

GIXRF–NEXAFS investigations on buried ZnO/Si interfaces: A first insight in changes of chemical states due to annealing of the specimen

(2009) M. Pagels et al.   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

A quarter-century of metrology using synchrotron radiation by PTB in Berlin

(2009) Burkhard Beckhoff et al.   PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS

Reference-free X-ray spectrometry based on metrology using synchrotron radiation

(2008) Burkhard Beckhoff   JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY

Speciation of deeply buriedTiOxnanolayers with grazing-incidence x-ray fluorescence combined with a near-edge x-ray absorption fine-structure investigation

(2008) Beatrix Pollakowski et al.   PHYSICAL REVIEW B

Depth-profiling of vertical sidewall nanolayers on structured wafers by grazing incidence X-ray flourescence

(2008) P. Hönicke et al.   SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY

Chemical character of BCxNylayers grown by CVD with trimethylamine borane

(2008) O. Baake et al.   X-RAY SPECTROMETRY