Modeling scanning probe microscope lateral dynamics using the probe–surface interaction signal

Image-based hysteresis modeling and compensation for an AFM piezo-scanner

(2009) Yudong Zhang et al.   ASIAN JOURNAL OF CONTROL

High-speed serial-kinematic SPM scanner: design and drive considerations

(2009) Kam K. Leang et al.   ASIAN JOURNAL OF CONTROL

Conditions for Image-Based Identification of SPM-Nanopositioner Dynamics

(2009) G.M. Clayton et al.   IEEE-ASME TRANSACTIONS ON MECHATRONICS

Design and Analysis of Discrete-Time Repetitive Control for Scanning Probe Microscopes

(2009) Ugur Aridogan et al.   JOURNAL OF DYNAMIC SYSTEMS MEASUREMENT AND CONTROL-TRANSACTIONS OF THE ASME

A Review of Feedforward Control Approaches in Nanopositioning for High-Speed SPM

(2009) Garrett M. Clayton et al.   JOURNAL OF DYNAMIC SYSTEMS MEASUREMENT AND CONTROL-TRANSACTIONS OF THE ASME

A control approach to cross-coupling compensation of piezotube scanners in tapping-mode atomic force microscope imaging

(2009) Ying Wu et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Signal transformation approach to fast nanopositioning

(2009) Abu Sebastian et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Simulation of dynamics-coupling in piezoelectric tube scanners by reduced order finite element analysis

(2008) Johannes Maess et al.   REVIEW OF SCIENTIFIC INSTRUMENTS