X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. I. Direct beam case

Title
X-ray diffraction contrast tomography: a novel technique for three-dimensional grain mapping of polycrystals. I. Direct beam case
Authors
Keywords
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Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 41, Issue 2, Pages 302-309
Publisher
International Union of Crystallography (IUCr)
Online
2008-03-14
DOI
10.1107/s0021889808001684

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