Automated Transmission-Mode Scanning Electron Microscopy (tSEM) for Large Volume Analysis at Nanoscale Resolution

Title
Automated Transmission-Mode Scanning Electron Microscopy (tSEM) for Large Volume Analysis at Nanoscale Resolution
Authors
Keywords
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Journal
PLoS One
Volume 8, Issue 3, Pages e59573
Publisher
Public Library of Science (PLoS)
Online
2013-03-27
DOI
10.1371/journal.pone.0059573

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