Serial Section Scanning Electron Microscopy (S3EM) on Silicon Wafers for Ultra-Structural Volume Imaging of Cells and Tissues

Title
Serial Section Scanning Electron Microscopy (S3EM) on Silicon Wafers for Ultra-Structural Volume Imaging of Cells and Tissues
Authors
Keywords
-
Journal
PLoS One
Volume 7, Issue 4, Pages e35172
Publisher
Public Library of Science (PLoS)
Online
2012-04-17
DOI
10.1371/journal.pone.0035172

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