Direct Measurement of the Thickness-Dependent Electronic Band Structure ofMoS2Using Angle-Resolved Photoemission Spectroscopy
出版年份 2013 全文链接
标题
Direct Measurement of the Thickness-Dependent Electronic Band Structure ofMoS2Using Angle-Resolved Photoemission Spectroscopy
作者
关键词
-
出版物
PHYSICAL REVIEW LETTERS
Volume 111, Issue 10, Pages -
出版商
American Physical Society (APS)
发表日期
2013-09-05
DOI
10.1103/physrevlett.111.106801
参考文献
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