Landau Quantization and the Thickness Limit of Topological Insulator Thin Films ofSb2Te3
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Title
Landau Quantization and the Thickness Limit of Topological Insulator Thin Films ofSb2Te3
Authors
Keywords
-
Journal
PHYSICAL REVIEW LETTERS
Volume 108, Issue 1, Pages -
Publisher
American Physical Society (APS)
Online
2012-01-05
DOI
10.1103/physrevlett.108.016401
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Related references
Note: Only part of the references are listed.- Topological Insulator Thin Films of Bi2Te3 with Controlled Electronic Structure
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