Measurement of the Spin Relaxation Time of Single Electrons in a Silicon Metal-Oxide-Semiconductor-Based Quantum Dot

Published 2010 View Full Article

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Title
Measurement of the Spin Relaxation Time of Single Electrons in a Silicon Metal-Oxide-Semiconductor-Based Quantum Dot
Authors
Keywords
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Journal
PHYSICAL REVIEW LETTERS
Volume 104, Issue 9, Pages -
Publisher
American Physical Society (APS)
Online
2010-03-03
DOI
10.1103/physrevlett.104.096801
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