Precise half-life measurement of the superallowedβ+emitterSi26

Title
Precise half-life measurement of the superallowedβ+emitterSi26
Authors
Keywords
-
Journal
PHYSICAL REVIEW C
Volume 82, Issue 3, Pages -
Publisher
American Physical Society (APS)
Online
2010-09-17
DOI
10.1103/physrevc.82.035502

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