Precise half-life measurement of the 26Si ground state

Published 2008 View Full Article

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Title
Precise half-life measurement of the 26Si ground state
Authors
Keywords
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Journal
EUROPEAN PHYSICAL JOURNAL A
Volume 37, Issue 2, Pages 151-158
Publisher
Springer Nature
Online
2008-07-28
DOI
10.1140/epja/i2008-10623-5
References
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