Discriminating short-range from van der Waals forces using total force data in noncontact atomic force microscopy

Uncertainties in forces extracted from non-contact atomic force microscopy measurements by fitting of long-range background forces

(2014) Adam Sweetman et al.   Beilstein Journal of Nanotechnology

Identifying passivated dynamic force microscopy tips on H:Si(100)

(2012) Peter Sharp et al.   APPLIED PHYSICS LETTERS

NC-AFM contrast formation on the calcite ($10\bar {1}4$) surface

(2012) Philipp Rahe et al.   JOURNAL OF PHYSICS-CONDENSED MATTER

Interplay of the tip–sample junction stability and image contrast reversal on a Cu(111) surface revealed by the 3D force field

(2012) Bartosz Such et al.   NANOTECHNOLOGY

Force and conductance during contact formation to a C60molecule

(2012) Nadine Hauptmann et al.   NEW JOURNAL OF PHYSICS

Understanding image contrast formation in TiO2with force spectroscopy

(2012) Ayhan Yurtsever et al.   PHYSICAL REVIEW B

Precise Orientation of a SingleC60Molecule on the Tip of a Scanning Probe Microscope

(2012) C. Chiutu et al.   PHYSICAL REVIEW LETTERS

Chemical Resolution at Ionic Crystal Surfaces Using Dynamic Atomic Force Microscopy with Metallic Tips

(2011) G. Teobaldi et al.   PHYSICAL REVIEW LETTERS

Interplay of Conductance, Force, and Structural Change in Metallic Point Contacts

(2011) Markus Ternes et al.   PHYSICAL REVIEW LETTERS

Flexible drift-compensation system for precise 3D force mapping in severe drift environments

(2011) Philipp Rahe et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

Three-Dimensional Atomic Force Microscopy - Taking Surface Imaging to the Next Level

(2010) Mehmet Z. Baykara et al.   ADVANCED MATERIALS

Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods

(2010) Clemens Barth et al.   ADVANCED MATERIALS

Ultrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurements

(2010) Shigeki Kawai et al.   PHYSICAL REVIEW B

Kelvin probe force microscopy and its application

(2010) Wilhelm Melitz et al.   SURFACE SCIENCE REPORTS

Dispersion interactions between optically anisotropic cylinders at all separations: Retardation effects for insulating and semiconducting single-wall carbon nanotubes

(2009) A. Šiber et al.   PHYSICAL REVIEW B

Concept for support and cleavage of brittle crystals

(2009) L. Tröger et al.   REVIEW OF SCIENTIFIC INSTRUMENTS

The Chemical Structure of a Molecule Resolved by Atomic Force Microscopy

(2009) L. Gross et al.   SCIENCE

Detailed scanning probe microscopy tip models determined from simultaneous atom-resolved AFM and STM studies of theTiO2(110)surface

(2008) Georg H. Enevoldsen et al.   PHYSICAL REVIEW B

Complex Patterning by Vertical Interchange Atom Manipulation Using Atomic Force Microscopy

(2008) Y. Sugimoto et al.   SCIENCE