Temperature and thickness evolution and epitaxial breakdown in highly strained BiFeO3thin films
Published 2012 View Full Article
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Title
Temperature and thickness evolution and epitaxial breakdown in highly strained BiFeO3thin films
Authors
Keywords
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Journal
PHYSICAL REVIEW B
Volume 85, Issue 2, Pages -
Publisher
American Physical Society (APS)
Online
2012-01-14
DOI
10.1103/physrevb.85.024113
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- Advances in the growth and characterization of magnetic, ferroelectric, and multiferroic oxide thin films
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- Competing phases inBiFeO3thin films under compressive epitaxial strain
- (2010) B. Dupé et al. PHYSICAL REVIEW B
- Strain-induced isosymmetric phase transition inBiFeO3
- (2010) Alison J. Hatt et al. PHYSICAL REVIEW B
- Evidence for Room-Temperature Multiferroicity in a Compound with a Giant Axial Ratio
- (2009) H. Béa et al. PHYSICAL REVIEW LETTERS
- A Strain-Driven Morphotropic Phase Boundary in BiFeO3
- (2009) R. J. Zeches et al. SCIENCE
- Single ferroelectric and chiral magnetic domain of single-crystallineBiFeO3in an electric field
- (2008) Seongsu Lee et al. PHYSICAL REVIEW B
- Spin-glass transition in single-crystalBiFeO3
- (2008) Manoj K. Singh et al. PHYSICAL REVIEW B
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