Temperature and thickness evolution and epitaxial breakdown in highly strained BiFeO3thin films

Title
Temperature and thickness evolution and epitaxial breakdown in highly strained BiFeO3thin films
Authors
Keywords
-
Journal
PHYSICAL REVIEW B
Volume 85, Issue 2, Pages -
Publisher
American Physical Society (APS)
Online
2012-01-14
DOI
10.1103/physrevb.85.024113

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